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Volumn 94, Issue 10, 2011, Pages 3237-3240

New low-loss microwave dielectric material ZnTiNbTaO 8

Author keywords

[No Author keywords available]

Indexed keywords

BOND VALENCES; LOW LOSS; LOW TEMPERATURES; MICROWAVE DIELECTRIC MATERIALS; MICROWAVE DIELECTRIC PROPERTIES; OXYGEN OCTAHEDRA; PACKING FRACTIONS; SINGLE PHASE; SOLID-STATE ROUTES; THEORETICAL DENSITY;

EID: 80053987881     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2011.04815.x     Document Type: Article
Times cited : (115)

References (15)
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    • 6 Compounds at Microwave Frequencies (A=Ca, Mg, Mn, Co, Ni, Zn, and B=Nb, Ta)
    • 6 Compounds at Microwave Frequencies (A=Ca, Mg, Mn, Co, Ni, Zn, and B=Nb, Ta)," Jpn. J. Appl. Phys., 36, 1318-20 (1997).
    • (1997) Jpn. J. Appl. Phys. , vol.36 , pp. 1318-1320
    • Lee, H.J.1    Kim, I.T.2    Hong, K.S.3
  • 4
    • 0014829002 scopus 로고
    • Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeability of Microwave Insulators
    • W. E. Courtney, " Analysis and Evaluation of a Method of Measuring the Complex Permittivity and Permeability of Microwave Insulators," IEEE Trans. Microwave Theory Tech., 18 [ 8 ] 476-85 (1970).
    • (1970) IEEE Trans. Microwave Theory Tech. , vol.18 , Issue.8 , pp. 476-485
    • Courtney, W.E.1
  • 6
    • 0348236443 scopus 로고    scopus 로고
    • PowderX: Windows-95-based program for powder X-ray diffraction data processing
    • C. Dong," PowderX: Windows-95-Based Program for Powder X-ray Diffraction Data Processing," J. Appl. Cryst., 32, 838 (1999). (Pubitemid 129794705)
    • (1999) Journal of Applied Crystallography , vol.32 , Issue.4 , pp. 838
    • Dong, C.1
  • 7
    • 0002211129 scopus 로고
    • A Profile Refinement Method for Nuclear and Magnetic Structures
    • H. M. Rietveld," A Profile Refinement Method for Nuclear and Magnetic Structures," J. Appl. Crystallogr., 2, 65 (1969).
    • (1969) J. Appl. Crystallogr. , vol.2 , pp. 65
    • Rietveld, H.M.1
  • 11
    • 4243983807 scopus 로고
    • Bond-Valence Parameters Obtained from a Systematic Analysis of the Inorganic Crystal Structure Database
    • I. D. Brown, and, D. Altermatt, " Bond-Valence Parameters Obtained From a Systematic Analysis of the Inorganic Crystal Structure Database," Acta. Cryst., B41, 244-7 (1985).
    • (1985) Acta. Cryst. , vol.41 B , pp. 244-247
    • Brown, I.D.1    Altermatt, D.2
  • 13
    • 0026469927 scopus 로고
    • Dielectric Constants of Silicate Garnets and the Oxide Additivity Rule
    • R. D. Shannon, and, G. R. Rossman, " Dielectric Constants of Silicate Garnets and the Oxide Additivity Rule," Amer. Miner., 77, 94-100 (1992).
    • (1992) Amer. Miner. , vol.77 , pp. 94-100
    • Shannon, R.D.1    Rossman, G.R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.