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Volumn 105, Issue 24, 2014, Pages

Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene

Author keywords

[No Author keywords available]

Indexed keywords

ATOMS; POINT DEFECTS; RAMAN SCATTERING;

EID: 84919819896     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4904469     Document Type: Article
Times cited : (6)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.