Molecular mapping of genes Yr64 and Yr65 for stripe rust resistance in hexaploid derivatives of durum wheat accessions PI 331260 and PI 480016

Theoretical and Applied Genetics

Volumn 127, Issue 10, 2014, Pages 2267-2277

  Cheng, P ^a   Xu, L S ^a   Wang, M N ^a   See, D R ^a,b   Chen, X M ^a,b  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b AGRICULTURAL RESEARCH SERVICE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINS; BIOMARKERS; DISEASE CONTROL; MAPPING; PLANTS (BOTANY);

CHROMOSOMAL LOCATION; CONTROL STRATEGIES; EFFECTIVE RESISTANCES; MARKER-ASSISTED SELECTION; MOLECULAR MAPPING; PUCCINIA STRIIFORMIS F. SP. TRITICI; SIMPLE SEQUENCE-REPEAT MARKERS; WHEAT CHROMOSOMES;

GENES;

PUCCINIA STRIIFORMIS F. SP. TRITICI; TRITICUM AESTIVUM; TRITICUM TURGIDUM SUBSP. DURUM;

GENETIC MARKER; MICROSATELLITE DNA; PLANT DNA;

BASIDIOMYCETES; CHROMOSOME MAP; DISEASE RESISTANCE; DOMINANT GENE; GENETIC MARKER; GENETICS; MICROBIOLOGY; PHENOTYPE; PLANT CHROMOSOME; PLANT DISEASE; PLANT GENE; POLYPLOIDY; WHEAT;

BASIDIOMYCOTA; CHROMOSOME MAPPING; CHROMOSOMES, PLANT; DISEASE RESISTANCE; DNA, PLANT; GENES, DOMINANT; GENES, PLANT; GENETIC MARKERS; MICROSATELLITE REPEATS; PHENOTYPE; PLANT DISEASES; POLYPLOIDY; TRITICUM;

EID: 84919727336     PISSN: 00405752     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00122-014-2378-8     Document Type: Article

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