Imaging josephson vortices on the surface superconductor SI (111)-(7 × 3)-In using a scanning tunneling microscope

Physical Review Letters

Volumn 113, Issue 24, 2014, Pages

  Yoshizawa, Shunsuke ^a   Kim, Howon ^b   Kawakami, Takuto ^a   Nagai, Yuki ^c   Nakayama, Tomonobu ^a   Hu, Xiao ^a   Hasegawa, Yukio ^b   Uchihashi, Takashi ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MICROSCOPES; TEMPERATURE;

CROSSOVER BEHAVIOR; JOSEPHSON COUPLING; JOSEPHSON VORTICES; LARGE SURFACE AREA; LOW-TEMPERATURE SCANNING TUNNELING MICROSCOPES; NUMERICAL CALCULATION; RELATIVE STRENGTH; ZERO-BIAS CONDUCTANCE;

VORTEX FLOW;

EID: 84918585781     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.113.247004     Document Type: Article

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