Electric field dependence of the electron mobility in bulk wurtzite ZnO

Bulletin of Materials Science

Volumn 37, Issue 7, 2014, Pages 1603-1606

  Alfaramawi, K ^a,b  

^a KING SAUD UNIVERSITY   (Saudi Arabia)

^b Alexandria University Faculty Of Science   (Egypt)

Author keywords

Electron drift velocity; Low field mobility; Saturation velocity

Indexed keywords

ELECTRIC FIELDS; ELECTRON MOBILITY; ELECTRONS; ZINC SULFIDE;

DOPING CONCENTRATION; ELECTRIC FIELD DEPENDENCE; ELECTRICAL CONDUCTION; ELECTRON DRIFT VELOCITY; LATTICE TEMPERATURES; LOW FIELD MOBILITY; NEGATIVE DIFFERENTIAL MOBILITY; SATURATION VELOCITY;

ZINC OXIDE;

EID: 84916608388     PISSN: 02504707     EISSN: 09737669     Source Type: Journal    
DOI: 10.1007/s12034-014-0720-z     Document Type: Article

References (15)

1. Arabshahi H, Rokn-Abadi R and Golafroz S 2009 Modern Phys. Lett. B23 2807
2. Arora N D, Hauser J R and Roulston D J 1982 IEEE Trans. Electron. Dev. 29 292
3. Bellotti E et al 2001 Int. J. High Speed Electron. Syst. 11 525
4. Bellotti E and Bertazzi F 2007 Transport parameters for electrons and holes In J Piprek (ed.) Nitride semiconductor devices: Principles and simulation (Weinheim: Wiley-VCH Verlag) Chap. 4, p 69
5. Bertazzi F, Bellotti E, Furno E and Goano M 2009 J. Electron. Mater. 38 1677
6. Caughey D M and Thomas R E 1967 Proc. IEEE 55 2192
7. Dorkel J M and Leturcq P H 1981 Solid-State Electron. 24 8211
8. Furno E, Bertazzi F, Goano M, Ghione G and Bellotti E 2008 Solid State Electron. 52 1796
9. Goano M, Bertazzi F, Penna M and Bellotti E 2007 J. Appl. Phys. 102 083709
10. Klaassen D B M 1992 Solid-State Electron. 35 953
11. Look D C, Reynolds D C, Sizelove J R, Jones R L, Litton C W, Cantwell G and Harsch W C 1998 Solid State Commun. 105 339
12. Masetti G, Severi M and Solmi S 1983 IEEE Trans. Electron Dev. 30 764
13. Ozgur U, Alivov Y I, Liu C, Teke A, Reshchikov M A, Dogan S, Avrutin V, Cho S J and Morkoc H 2005 J. Appl. Phys. 98 041301
14. Schroder D K 1987 Modular Series on solid state devices: Advanced MOSDevices (New York: Addison-Wesley Publishing Company)
15. Yang L, Yang Yao Q, Zhang X, Liu Q and Hao V 2010 Proceedings of 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) (Shanghai, China: IEEE Press) p 1566