SCOPUS 정보 검색 플랫폼

Analytical Chemistry

Volumn 86, Issue 23, 2014, Pages 11666-11672

Electrophoretic migration and particle collisions in scanning electrochemical microscopy

(2) Boika, Aliaksei a,b Bard, Allen J a

a UNIVERSITY OF TEXAS AT AUSTIN (United States)

b UNIVERSITY OF AKRON (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC FIELDS; ELECTRODES; ELECTROLYTES; FEEDBACK; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY;

CHARGED NANOPARTICLES; COUNTER ELECTRODES; ELECTROLYTE SOLUTIONS; ELECTROPHORETIC MIGRATION; LOW ELECTROLYTE CONCENTRATION; PARTICLE COLLISION; SCANNING ELECTROCHEMICAL MICROSCOPY; SUBSTRATE ELECTRODES;

ANALYTIC EQUIPMENT;

EID: 84915731680 PISSN: 00032700 EISSN: 15206882 Source Type: Journal
DOI: 10.1021/ac502944n Document Type: Article

Times cited : (24)

References (15)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.