Analysis of diffusion-controlled stochastic events of iridium oxide single nanoparticle collisions by scanning electrochemical microscopy

Journal of the American Chemical Society

Volumn 134, Issue 16, 2012, Pages 7102-7108

  Kwon, Seong Jung ^a   Bard, Allen J ^b  

^a Konkuk University   (South Korea)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COLLISION EVENTS; COLLISION FREQUENCY; CURRENT DECAY; CURRENT RESPONSE; ELECTROCATALYTIC; ELECTROCHEMICAL DETECTION; HIGH CONCENTRATION; INSULATING SURFACES; IRIDIUM OXIDES; OXYGEN SCAVENGERS; RANDOM WALK; SCANNING ELECTROCHEMICAL MICROSCOPES; SCANNING ELECTROCHEMICAL MICROSCOPY; SINGLE NANOPARTICLE; SINGLE-PARTICLE; STOCHASTIC EVENTS; THEORETICAL APPROACH; ULTRAMICROELECTRODES; WATER OXIDATION;

ADSORPTION; IRIDIUM COMPOUNDS; MICROELECTRODES; PLATINUM; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SCAVENGING;

ANALYTIC EQUIPMENT;

IRIDIUM OXIDE NANOPARTICLE; NANOPARTICLE; OXYGEN; PLATINUM; UNCLASSIFIED DRUG; WATER;

ARTICLE; CATALYSIS; DIFFUSION; ELECTROCHEMICAL DETECTION; MICROELECTRODE; NEGATIVE FEEDBACK; OXIDATION; SCANNING ELECTROCHEMICAL MICROSCOPY; ULTRAMICROELECTRODE;

BOROHYDRIDES; DIFFUSION; IRIDIUM; MICROELECTRODES; MICROSCOPY, ELECTRON, SCANNING; NANOPARTICLES; PLATINUM; SURFACE PROPERTIES;

EID: 84860335450     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja300894f     Document Type: Article

References (14)

1. Kwon, S. J.; Fan, F.-R. F.; Bard, A. J. J. Am. Chem. Soc. 2010, 132, 13165
2. Xiao, X.; Bard, A. J. J. Am. Chem. Soc. 2007, 129, 9610
3. Xiao, X.; Fan, F.-R. F.; Zhou, J.; Bard, A. J. J. Am. Chem. Soc. 2008, 130, 16669
4. Xiao, X.; Pan, S.; Jang, J. S.; Fan, F.-R. F.; Bard, A. J. J. Phys. Chem. C 2009, 113, 14978
5. Bard, A. J.; Faulkner, L. R. Electrochemical Methods, Fundamentals and Applications, 2 nd ed.; John Wiley & Sons: New York, 2001.
6. White, R. J.; White, H. S. Anal. Chem. 2005, 77, 215A
7. Kwon, S. J.; Zhou, H.; Fan, F.-R. F.; Vorobyev, V.; Zhang, B.; Bard, A. J. Phys. Chem. Chem. Phys. 2011, 13, 5394
8. Peterson, R. R.; Cliffel, D. E. Langmuir 2006, 22, 10307
9. Hoertz, P. G.; Kim, Y.-I.; Youngblood, W. J.; Mallouk, T. E. J. Phys. Chem. B 2007, 111, 6845-6856
10. Nakagawa, T.; Beasley, C. A.; Murray, R. W. J. Phys. Chem. C 2009, 113, 12958-12961
11. Yagi, M.; Tomita, E.; Sakita, S.; Kuwabara, T.; Nagai, K. J. Phys. Chem. B 2005, 109, 21489-21491
12. Scanning Electrochemical Microscopy; Bard, A. J.; Mirkin, M. V., Eds.; Marcel Dekker: New York, 2001.
13. Einstein, A. Ann. Phys. 1905, 17, 549
14. Zoski, C. G.; Aguilar, J. C.; Bard, A. J. Anal. Chem. 2003, 75, 2959