Imaging space charge regions in Sm-doped ceria using electrochemical strain microscopy

Applied Physics Letters

Volumn 105, Issue 20, 2014, Pages

  Chen, Qian Nataly ^a   Adler, Stuart B ^a   Li, Jiangyu ^a  

^a University of Washington   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SPACE CHARGE; SEMICONDUCTOR JUNCTIONS;

CONDUCTIVITY DATA; ELECTROCHEMICAL STRAIN MICROSCOPIES; EXPOSED SURFACES; GRAIN BOUNDARY CORES; ORDERS OF MAGNITUDE; POSITIVELY CHARGED; SPACE CHARGE REGIONS; SPATIALLY RESOLVED;

GRAIN BOUNDARIES;

EID: 84911468337     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4901102     Document Type: Article

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