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Volumn , Issue , 2002, Pages

Four parameter fitting of sine wave testing results: Iteration and convergence

Author keywords

ADC testing; Fourparameter method; IEEE STD 1241; MATLAB; Sine wave method

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ITERATIVE METHODS; MATLAB;

EID: 84909957635     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (6)

References (12)
  • 3
    • 0038651596 scopus 로고    scopus 로고
    • Improving convergence of sine fitting algorithms
    • September 13-14, Lisbon, Portugal
    • M. Fonseca da Silva, A. Cruz Serra, 'Improving Convergence Of Sine Fitting Algorithms', Proc. 6 Euro Workshop on ADC Modelling and Testing, September 13-14, 2001, Lisbon, Portugal. pp. 121-124.
    • (2001) Proc. 6 Euro Workshop on ADC Modelling and Testing , pp. 121-124
    • Da Silva, M.F.1    Serra, A.C.2
  • 7
    • 84943300008 scopus 로고    scopus 로고
    • Standard environment for the sine wave test of ADC'S
    • February
    • J. Márkus and I. Kollár, "Standard environment for the sine wave test of ADC's, " Submitted to the Measurement Journal of IMEKO, February, 2001.
    • (2001) The Measurement Journal of IMEKO
    • Márkus, J.1    Kollár, I.2
  • 8
    • 0031200280 scopus 로고    scopus 로고
    • Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
    • August
    • N. Giaquinto and A. Trotta, "Fast and accurate ADC testing via an enhanced sine wave fitting algorithm, " IEEE Trans. on Instrumentation and Measurement, vol. 46, no. 4, pp. 1020- 1024, August 1997.
    • (1997) IEEE Trans. on Instrumentation and Measurement , vol.46 , Issue.4 , pp. 1020-1024
    • Giaquinto, N.1    Trotta, A.2
  • 9
    • 0033705244 scopus 로고    scopus 로고
    • ADC testing based on IEEE 1057-94 standard - some critical notes
    • Baltimore, Maryland USA, May
    • P. Arpaia et al., "ADC testing based on IEEE 1057-94 standard - some critical notes, " in Proc. of the 17th IEEE Instr. and Meas. Technology Conference, IMTC/2000, Baltimore, Maryland USA, May 2000, vol. 1, pp. 119-124.
    • (2000) Proc. of the 17th IEEE Instr. and Meas. Technology Conference, IMTC/2000 , vol.1 , pp. 119-124
    • Arpaia, P.1
  • 12
    • 84909949817 scopus 로고    scopus 로고
    • Test data. URL: http://www.mit.bme.hu/......services/ieee/ADC-test/misleading-data/.
    • Test Data


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.