Standard framework for IEEE-STD-1241 in MATLAB

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 3, Issue , 2001, Pages 1847-1852

  Markus J ^a   Kollar I ^a  

^a BUDAPEST UNIVERSITY OF TECHNOLOGY AND ECONOMICS   (Hungary)

Author keywords

ADC testing; Data acquisition; IEEE STD 1241; MATLAB; Sine wave test method; Standardization; Windowing

Indexed keywords

ALGORITHMS; DATA ACQUISITION; DIGITAL SIGNAL PROCESSING; GRAPHICAL USER INTERFACES; WAVEFORM ANALYSIS;

QUAZI STATIC OPERATION; SINE WAVE TEST;

ANALOG TO DIGITAL CONVERSION;

EID: 0034829276     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (19)

1. Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Sec. 2: Blank detail specification for linear analogue-to-digital converters, 2 edition
2. IEEE Std 1241 draft - Standard for terminology and test methods for analog-to-digital converters, version VS022500
3. IEEE Std 1057-94 - IEEE standard for digitizing waveform recorders
4. DYNAD: A framework IV SMT project addressed to the development of dynamic test techniques for analog-to-digital converters
5. Dynamic testing of waveform recorders
6. Sine-fitting software for IEEE standards 1057 and 1241
7. Standard environment for the sine wave test of ADC's
8. Fast and accurate ADC testing via an enhanced sine wave fitting algorithm
9. The modulo time plot - A useful data acquisition diagnostic tool
10. A method for characterizing waveform recorder errors using the power spectral distribution
11. Evaluation of sine wave tests of ADCs from windowed data
12. Windows for ADC dynamic testing via frequency-domain analysis
13. System identification for data acquisition characterization
14. ADC characterization by an eigenvalue method
15. ADC testing based on IEEE 1057-94 standard - Some critical notes
16. Measurement of ADC integral nonlinearity via DFT
17. A comparative evaluation of some practical algorithms used in the effective bits test of waveform recorders