Microstructural analysis of 9.7% efficient Cu2ZnSnSe4 thin film solar cells

Applied Physics Letters

Volumn 105, Issue 18, 2014, Pages

  Buffiere M ^a,b   Brammertz, G ^c   Batuk, M ^d   Verbist, C ^d   Mangin, D ^e   Koble, C ^f   Hadermann, J ^d   Meuris, M ^c   Poortmans, J ^a,b,c  

^a UNIVERSITY OF LEUVEN   (Belgium)

^b IMEC   (Belgium)

^c HASSELT UNIVERSITY   (Belgium)

^d UNIVERSITY OF ANTWERP   (Belgium)

^e UNIVERSITÉ DE LORRAINE   (France)

^f HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM SULFIDE; GRAIN BOUNDARIES; SOLAR CELLS;

AMORPHOUS LAYER; AVERAGE COMPOSITION; LARGE CRYSTAL; MICROSTRUCTURAL ANALYSIS; SECONDARY PHASE; THIN FILM SOLAR CELLS; TOTAL-AREA EFFICIENCY; UNDERLYING LAYERS;

SEMICONDUCTING SELENIUM COMPOUNDS;

EID: 84909601471     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4901401     Document Type: Article

References (23)

1. S. Siebentritt and S. Schorr, Prog. Photovoltaics: Res. Appl. 20, 512 (2012).
2. S. Delbos, EPJ Photovoltaics 3, 35004 (2012).
3. K. Ito and T. Nakazawa, Jpn. J. Appl. Phys., Part 1 27, 2094 (1988).
4. C. Platzer-Björkman, J. Scragg, H. Flammersberger, T. Kubart, and M. Edoff, Sol. Energy Mater. Sol. Cells 98, 110 (2012).
5. C. Persson, J. Appl. Phys. 107, 53710 (2010).
6. T. Todorov, J. Tang, S. Bag, O. Gunawan, T. Gokmen, Y. Zhu, and D. B. Mitzi, Adv. Energy Mater. 3, 34 (2013).
7. W. Wang, M. Winkler, O. Gunawan, T. Gokmen, T. Todorov, Y. Zhu, and D. Mitzi, Adv. Energy Mater. 4, 1 (2014).
8. A. Fairbrother, X. Fontané, V. Izquierdo-Roca, M. Placidi, D. Sylla, M. Espindola-Rodriguez, S. López-Mariño, F. Pulgarín, O. Vigil-Galán, A. Pérez-Rodríguez, and E. Saucedo, Prog. Photovoltaics: Res. Appl. 22, 479-487 (2014).
9. A. Redinger, K. Hönes, X. Fontané, V. Izquierdo-Roca, E. Saucedo, N. Valle, A. Pérez-Rodríguez, and S. Siebentritt, Appl. Phys. Lett. 98, 101907 (2011).
10. T. Tanaka, T. Sueishi, K. Saito, Q. Guo, M. Nishio, K. Yu, and W. Walukiewicz, J. Appl. Phys. 111, 053522 (2012).
11. J. Just, D. Lutzenkirchen-Hecht, R. Frahm, S. Schorr, and T. Unold, Appl. Phys. Lett. 99, 262105 (2011).
12. T. Schwarz, O. Cojocaru-Miredin, P. Choi, M. Mousel, A. Redinger, S. Siebentritt, and D. Raabe, Appl. Phys. Lett. 102, 042101 (2013).
13. S. López-Marino, M. Placidi, A. Pérez-Tomás, J. Llobet, V. Izquierdo-Roca, X. Fontané, A. Fairbrother, M. Espíndola-Rodríguez, D. Sylla, A. Pérez-Rodríguez, and E. Saucedo, J. Mater. Chem. A 1, 8338 (2013).
14. J. Scragg, J. Wätjen, M. Edoff, T. Ericson, T. Kubart, and C. Platzer-Björkman, J. Am. Chem. Soc. 134(47), 19330 (2012).
15. G. Brammertz, M. Buffière, S. Oueslati, H. ElAnzeery, K. Ben Messaoud, S. Sahayaraj, C. Köble, M. Meuris, and J. Poortmans, Appl. Phys. Lett. 103, 163904 (2013).
16. J. Klaer, I. Luck, A. Boden, R. Klenk, I. Gavilanes Perez, and R. Scheer, Thin Solid Films 431-432, 534 (2003).
17. Ch. Köble, D. Greiner, J. Klaer, R. Klenk, A. Meeder, and F. Ruske, Thin Solid Films 518, 1204 (2009).
18. 4 thin films from annealing of Cu-Zn-Ge precursor layers," Thin Solid Films (published online).
19. B. Mendis, M. Goodman, J. Major, A. Taylor, K. Durose, and D. Halliday, J. Appl. Phys. 112, 124508 (2012).
20. See supplementary material at http://dx.doi.org/10.1063/1.4901401 for more HAADF-STEM images, overview EDX maps, and EDX spectra performed on this sample.
21. G. Brammertz, M. Buffière, Y. Mevel, Y. Ren, A. E. Zaghi, N. Lenaers, Y. Mols, C. Koeble, J. Vleugels, M. Meuris, and J. Poortmans, Appl. Phys. Lett. 102, 013902 (2013).
22. J. T. Wätjen, J. J. Scragg, M. Edoff, S. Rubino, and C. Platzer-Björkman, Appl. Phys. Lett. 102, 051902 (2013).
23. J. T. Wätjen, J. J. Scragg, T. Ericson, M. Edoff, and C. Platzer-Björkman, Thin Solid Films 535, 31 (2013).