Quantitative angle-resolved small-spot reflectance measurements on plasmonic perfect absorbers: Impedance matching and disorder effects

ACS Nano

Volumn 8, Issue 10, 2014, Pages 10885-10892

  Tittl, Andreas ^a   Harats, Moshe G ^b   Walter, Ramon ^a   Yin, Xinghui ^a   Schäferling, Martin ^a   Liu, Na ^c   Rapaport, Ronen ^b   Giessen, Harald ^a  

^a UNIVERSITY OF STUTTGART   (Germany)

^b HEBREW UNIVERSITY OF JERUSALEM   (Israel)

^c MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

Author keywords

angular dispersion; impedance matching; perfect absorbers; plasmonics

Indexed keywords

DISPERSIONS; ELECTRON BEAM LITHOGRAPHY; IMPEDANCE MATCHING (ELECTRIC); REFLECTION; REFLECTOMETERS; THERMOGRAPHY (IMAGING);

ANGULAR DISPERSIONS; BUILDING BLOCKES; PERFECT ABSORBER; PLASMONIC DEVICES; QUANTITATIVE MODELING; REAL AND IMAGINARY; TECHNOLOGICAL APPLICATIONS; TRACE GAS DETECTION;

PLASMONICS;

EID: 84908430954     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn504708t     Document Type: Article

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