Z calibration of the LNE ultra precision coordinate measuring machine

Proceedings of the 10th Anniversary International Conference of the European Society for Precision Engineering and Nanotechnology, EUSPEN 2008

Volumn 2, Issue , 2008, Pages 348-353

  Boripatkosol, S ^b   Lahousse, L ^a   Leleu, S ^b   David, J ^b   Ducourtieux, S ^a   Coorevits, T ^b   Gibaru, O ^b  

^a LABORATOIRE NATIONAL DE MÉTROLOGIE ET D ESSAIS LNE   (France)

^b ARTS ET MÉTIERS PARISTECH   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84908198668     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. Elster C, Weingärtner I, Schulz M. "Coupled distance sensor systems for high-accuracy topography measurement: Accounting for scanning stage and systematic sensor errors. " Precision Eng. 2006;30:32-38
2. Wei Gao, Satoshi Kiyono " High accuracy profile measurement of a machined surface by the combined method"measurement vol. 19, No. 1, pp. 55-64, 1996
3. L. Lahousse, S. Leleu, J. David, O. Gibaru, S. Ducourtieux "Z calibration of the LNE ultra precision coordinate measuring machine. " 7th euspen International Conference2007.
4. Wei Gao, Jun Yokoyama, Hidetoshi Kojima, Satoshi Kiyono "Precision measurement of cylinder straightness using a scanning multi-probe system"Precision Eng. 2002;26:279-288