Volume measurements of 28Si spheres by an improved optical interferometer and ellipsometer to determine the Avogadro constant

CPEM Digest (Conference on Precision Electromagnetic Measurements)

Volumn , Issue , 2014, Pages 210-211

  Kuramoto, N ^a   Azuma, Y ^a   Inaba, H ^a   Hong, F L ^a   Fujii, K ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Avogadro constant; diameter measurement; optical interferometer; silicon crystal; spectroscopic ellipsometer; volume measurement

Indexed keywords

CRYSTALS; ELLIPSOMETRY; INTERFEROMETERS; SILICON; SPECTROSCOPIC ANALYSIS; SPHERES; SURFACE ANALYSIS; TITRATION;

AVOGADRO CONSTANT; DIAMETER MEASUREMENT; OPTICAL INTERFEROMETER; SILICON CRYSTAL; SPECTROSCOPIC ELLIPSOMETERS;

VOLUME MEASUREMENT;

EID: 84907898474     PISSN: 05891485     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CPEM.2014.6898333     Document Type: Conference Paper

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