A simple model for analogue applications of dynamic threshold MOSTs

European Solid-State Device Research Conference

Volumn 13-15 Sept. 1999, Issue , 1999, Pages 484-487

  Smedes, T ^a   Knol, J ^a   Annema, A J ^b  

^a NXP SEMICONDUCTORS   (Netherlands)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOGUE APPLICATIONS; DEVICE SIMULATIONS; DYNAMIC THRESHOLD; PRACTICAL MODEL; SIMPLE MODELING;

EID: 84907887596     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (4)

1. AJ. Annema, "Low-Power Bandgap References featuring DTMOSTs", accepted for publication in IEEE Journal of SOIid-State Circuits
2. N. Lindert, T. Sugii, S. Tang and C. Hu, "Dynamic Threshold Pass-Transistor Logic for Improved Delay at Lower power Supply Voltages", IEEE Journal of SOIid-State Circuits, Vol. 34, No. I, January 1999, pp. 85-89.
3. M. Conti et al. 'Test Structure for Mismatch Characterisation of MOS Transistors in Subthreshold Regime", Proc. IEEE 1997 Int. conf. on Microelectronic Test Structures, Vol. 10, March 1997, pp. 173-178.
4. P.A. Stolk, F.P. Widdershoven and D.B.M. Klaassen, "Modeling Statistical Dopant Fluctuations in MOS Transistors", IEEE Transactions on Electron Devices, Vol. 45, September 1998, pp. 1960-1971.