Effects of thermal treatment and depth profiling analysis of solution processed bulk-heterojunction organic photovoltaic cells

Journal of Colloid and Interface Science

Volumn 436, Issue , 2014, Pages 9-15

  Mbule, Pontsho S ^a   Swart, Hendrik C ^a   Ntwaeaborwa, Odireleng M ^a  

^a UNIVERSITY OF THE FREE STATE   (South Africa)

Author keywords

Buffer layer; Bulk heterojunction; Interface; Organic solar cells; TOF SIMS; Zinc oxide

Indexed keywords

INTERFACES (MATERIALS); ZINC OXIDE;

BULK HETEROJUNCTION; DEPTH-PROFILING ANALYSIS; ORGANIC PHOTOVOLTAIC CELLS; ORGANIC SOLAR CELL; SOLUTION-PROCESSED; TOF SIMS;

BUFFER LAYERS;

INDIUM; NANOCRYSTAL; NANOPARTICLE; SILICON; TIN; ZINC ION; ZINC OXIDE;

ARTICLE; BULK HETEROJUNCTION; CELL JUNCTION; CELLS; COMPARATIVE STUDY; ELECTRICAL PARAMETERS; ELECTRON TRANSPORT; ENERGY ABSORPTION; LIGHT ABSORPTION; MASS SPECTROMETRY; ORGANIC SOLAR CELL; PARTICLE SIZE; PHOTOOXIDATION; THERMAL EXPOSURE; TIME OF FLIGHT MASS SPECTROMETRY; ULTRAVIOLET RADIATION;

EID: 84907764680     PISSN: 00219797     EISSN: 10957103     Source Type: Journal    
DOI: 10.1016/j.jcis.2014.09.005     Document Type: Article

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