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Volumn , Issue , 2003, Pages 497-500

Deep trench isolation for 600 v SOI power devices

Author keywords

[No Author keywords available]

Indexed keywords

DEEP TRENCH ISOLATION; SOI POWER DEVICES;

EID: 84907703974     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2003.1256922     Document Type: Conference Paper
Times cited : (10)

References (6)
  • 1
    • 0142212502 scopus 로고    scopus 로고
    • 600V bipolar power devices on thick soi
    • L. Clavelier and al. "600V bipolar power devices on thick SOI", ESSDERC'01, p. 395
    • ESSDERC'01 , pp. 395
    • Clavelier, L.1
  • 2
    • 1842851675 scopus 로고    scopus 로고
    • Vertical high voltage devices on thick soi with back end trench formation
    • U. Heinle and al. "Vertical high voltage devices on thick SOI with back end trench formation", ESSDERCG2, p. 395
    • ESSDERCG2 , pp. 395
    • Heinle, U.1
  • 3
    • 0029709963 scopus 로고    scopus 로고
    • Bonded soi technologies for high voltage applications
    • Takao Abe and al. "Bonded SOI Technologies for High Voltage Applications", Proc. of 8th 1SPSD, 1996. p. 41
    • (1996) Proc. of 8th 1SPSD , pp. 41
    • Abe, T.1
  • 4
    • 0029203351 scopus 로고
    • A dielectric isolated high-voltage ic-technology for off-line applications
    • M. Stoisiek and al. "A dielectric isolated high-voltage IC-Technology for Off-line applications". Proc. of 7'h 1SPSD, 1995, p. 325
    • (1995) Proc. of 7'h 1SPSD , pp. 325
    • Stoisiek, M.1
  • 5
    • 84907548996 scopus 로고    scopus 로고
    • A 500v 1a l-chip inverter ic on soi wafer
    • May
    • K. Endo and al. "A 500V 1A l-chip inverter IC on SOI wafer", PC1M Proc. May 1998, p. 145
    • (1998) PC1M Proc , pp. 145
    • Endo K.Al.1
  • 6
    • 84907524447 scopus 로고    scopus 로고
    • Deep trench isolation in bonded wafer soi lcs using high density icp etcher
    • C. S. Covven and al. "Deep trench isolation in bonded wafer SOI lcs using high density ICP etcher". El. Chein. Soc. Proc. vol 96-3, p. 364
    • El. Chein. Soc. Proc , vol.96-103 , pp. 364
    • Covven, C.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.