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Volumn , Issue , 2002, Pages 175-178

Enhanced intrinsic gain (gm/gd) of PMOSFETs with a Si0.7Ge0.3 channel

Author keywords

[No Author keywords available]

Indexed keywords

GERMANIUM; MOSFET DEVICES;

EID: 84907692854     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2002.194898     Document Type: Conference Paper
Times cited : (14)

References (12)
  • 3
    • 0034217354 scopus 로고    scopus 로고
    • High temperature formed SiGe P-MOSFET's with good device characteristics
    • Y.H. Wu and A. Chin, "High temperature formed SiGe P-MOSFET's with good device characteristics", IEEE Electron Device Letters 21, 2000, pp. 350-352.
    • (2000) IEEE Electron Device Letters , vol.21 , pp. 350-352
    • Wu, Y.H.1    Chin, A.2
  • 6
    • 84907701008 scopus 로고    scopus 로고
    • to be published
    • M. von Haartman, et al., to be published.
    • Von Haartman, M.1
  • 8
    • 84907703752 scopus 로고    scopus 로고
    • ATLAS from Silvaco Corp
    • ATLAS from Silvaco Corp.
  • 9
    • 0003750001 scopus 로고    scopus 로고
    • McGraw-Hill book Co, Singapore
    • Y. Tsividis, Operation and modeling of the MOS transistor 2nd edition, McGraw-Hill book Co, Singapore, 1999.
    • (1999) nd Edition
    • Tsividis, Y.1
  • 10
    • 0020186076 scopus 로고
    • Charge accumulation and mobility in thin dielectric MOS transistors
    • C.G. Sodini, T.W. Ekstedt and J.L. Moll, "Charge accumulation and mobility in thin dielectric MOS transistors", Solid State Electronics 25(9), 1982, pp. 833-841.
    • (1982) Solid State Electronics , vol.25 , Issue.9 , pp. 833-841
    • Sodini, C.G.1    Ekstedt, T.W.2    Moll, J.L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.