Bulk wafer defects observable in vision chips

European Solid-State Device Research Conference

Volumn , Issue , 2002, Pages 659-662

  Rantzer, Annika ^a,b   Svensson, Christer ^b  

^a Integrated Vision Products AB   (Sweden)

^b LINKÖPING UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; CRYSTAL DEFECTS; DEFECTS;

BULK WAFERS; CMOS CAMERA; INTENSITY DEPENDENCE; VISION CHIPS; WAVELENGTH DEPENDENCE;

COMPUTER VISION;

EID: 84907691757     PISSN: 19308876     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2002.195017     Document Type: Conference Paper

References (6)

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6. Properties of silicon, (EMIS datareviews series, No 4), Inspec/IEE, ISBN; 0852964757, London, 1988.