The energy evolution of surface plasmons on an oxidized aluminum surface: The role of the atomic polarizability of oxygen adsorbates and the thickness of the oxide layer

Journal of Physics D: Applied Physics

Volumn 47, Issue 42, 2014, Pages

  Li, Jiang Tao ^a   Parisi, Jason ^b   Wang, Zhen Bin ^a   Pu, Yi Kang ^a  

^a TSINGHUA UNIVERSITY   (China)

^b Yale University   (United States)

Author keywords

dielectric constant; dielectric response; oxidation; polarizability; surface plasmon

Indexed keywords

ALUMINUM; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISSIPATION; MULTILAYERS; OXIDATION; OXYGEN; PERMITTIVITY; PHOTOELECTRON SPECTROSCOPY; POLARIZATION; X RAY PHOTOELECTRON SPECTROSCOPY;

DIELECTRIC RESPONSE; ELECTROMAGNETIC MODELING; FREQUENCY DEPENDENT POLARIZABILITY; POLARIZABILITIES; RELATIVE DIELECTRIC CONSTANT; SURFACE PLASMONS; THICKNESS OF THE OXIDE LAYERS; X RAY PHOTOEMISSION SPECTROSCOPY;

PLASMONS;

EID: 84907661965     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/47/42/425304     Document Type: Article

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