Single-shot pulse duration monitor for extreme ultraviolet and X-ray free-electron lasers

Nature Communications

Volumn 4, Issue , 2013, Pages

  Riedel, R ^a,b   Al Shemmary, A ^c   Gensch, M ^d   Golz, T ^c   Harmand, M ^c   Medvedev, N ^c   Prandolini, M J ^b   Sokolowski Tinten, K ^e   Toleikis, S ^c   Wegner, U ^c   Ziaja, B ^c,f   Stojanovic, N ^c   Tavella, F ^b  

^a UNIVERSITY OF HAMBURG   (Germany)

^b HELMHOLTZ INSTITUTE JENA   (Germany)

^c DESY   (Germany)

^d INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^e UNIVERSITY OF DUISBURG ESSEN   (Germany)

^f INSTITUTE OF NUCLEAR PHYSICS   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ARRIVAL TIME; ELECTRON; LASER; NUMERICAL MODEL; REFLECTIVITY; RESOLUTION; SILICON; ULTRAVIOLET RADIATION;

ARTICLE; EXTREME ULTRAVIOLET LASER; FEASIBILITY STUDY; LASER; RADIATION ABSORPTION; ULTRAVIOLET RADIATION; X RAY FREE ELECTRON LASER;

EID: 84877777877     PISSN: None     EISSN: 20411723     Source Type: Journal    
DOI: 10.1038/ncomms2754     Document Type: Article

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