Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 8504, Issue , 2012, Pages

  Bionta, Mina R ^a   French, Doug ^a   Cryan, James P ^b   Glownia, James M ^a,c   Hartmann, Nick ^a   Nicholson, David J ^a,c   Baker, Kevin ^d   Bostedt, Christoph ^a   Cammarrata, Marco ^e   Chollet, Matthieu ^a   Ding, Yuntao ^a   Fritz, David M ^a   Durbin, Steve M ^e   Feng, Yiping ^a   Harmand, Marion ^f   Fry, Alan R ^a   Kane, Daniel J ^g   Krzywinski, Jacek ^a   Lemke, Henrik T ^a   Messerschmidt, Marc ^a   Ratner, Daniel F ^a   Schorb, Sebastian ^a   Toleikisj, Sven ^f   Zhu, Diling ^a   White, William E ^a   Coffee, Ryan N ^a   more..

^a SLAC NATIONAL ACCELERATOR LABORATORY   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c STANFORD UNIVERSITY   (United States)

^d LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^e UNIVERSITÉ DE RENNES 1   (France)

^f DESY   (Germany)

^g Mesa Photonics LLC   (United States)

Author keywords

Dielectric response; FEL; LCLS; Spectral encoding; Thin films; Ultrafast dynamics; Ultrafast optics; Ultrafast x rays

Indexed keywords

DIELECTRIC RESPONSE; LCLS; SPECTRAL ENCODING; ULTRA-FAST; ULTRA-FAST DYNAMICS; ULTRAFAST OPTICS;

ENCODING (SYMBOLS); FREE ELECTRON LASERS; LASERS; MEASUREMENTS; PHOTOMAPPING; SEMICONDUCTING SILICON; THIN FILMS;

X RAYS;

EID: 84872514975     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.929097     Document Type: Conference Paper

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