Recent activity of international comparison for nanoparticle size measurement

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 9232, Issue , 2014, Pages

  Takahashi, Kayori ^a   Takahata, Keiji ^a   Misumi, Ichiko ^a   Sugawara, Kentaro ^a   Gonda, Satoshi ^a   Ehara, Kensei ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Dynamic light scattering; Nanoparticle; Particle size; Standardization; Suspension; Uncertainty

Indexed keywords

ATOMIC FORCE MICROSCOPY; DIFFUSION; DYNAMIC LIGHT SCATTERING; EXTRAPOLATION; NANOPARTICLES; NANOSTRUCTURED MATERIALS; RISK ASSESSMENT; SCANNING ELECTRON MICROSCOPY; STANDARDIZATION; SUSPENSIONS (FLUIDS); UNCERTAINTY ANALYSIS;

APPARENT DIFFUSION COEFFICIENT; ASIA-PACIFIC METROLOGY PROGRAMME; DIFFERENTIAL MOBILITY ANALYZERS; INTERNATIONAL COMPARISON; MEAN PARTICLE DIAMETER; MEASUREMENT ACCURACY; NANOPARTICLE SIZE MEASUREMENT; UNCERTAINTY;

PARTICLE SIZE;

EID: 84906656266     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.2063532     Document Type: Conference Paper

References (11)

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2. ISO 22412: 2008, Particle size analysis-Dynamic light scattering (DLS).
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