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Volumn 1, Issue 4, 2014, Pages 338-346

Improvements in the detection and characterization of engineered nanoparticles using spICP-MS with microsecond dwell times

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EID: 84906248852     PISSN: 20518153     EISSN: 20518161     Source Type: Journal    
DOI: 10.1039/c4en00058g     Document Type: Article
Times cited : (153)

References (45)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.