Wrinkling of atomic planes in ultrathin Au nanowires

Nano Letters

Volumn 14, Issue 8, 2014, Pages 4859-4866

  Roy, Ahin ^a   Kundu, Subhajit ^a   Müller, Knut ^b   Rosenauer, Andreas ^b   Singh, Saransh ^c   Pant, Prita ^c   Gururajan, M P ^c   Kumar, Praveen ^a   Weissmuller J ^d,e   Singh, Abhishek Kumar ^a   Ravishankar, N ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

^b UNIVERSITY OF BREMEN   (Germany)

^c INDIAN INSTITUTE OF TECHNOLOGY BOMBAY   (India)

^d HAMBURG UNIVERSITY OF TECHNOLOGY   (Germany)

^e INSTITUTE OF MATERIALS RESEARCH   (Germany)

Author keywords

aberration corrected microscopy; Au nanowire; surface stress; wrinkling

Indexed keywords

ATOMS; CALCULATIONS; CONTINUUM MECHANICS; MOLECULAR DYNAMICS; SURFACE PROPERTIES; WIRE;

ABERRATION-CORRECTED MICROSCOPIES; ATOMIC-RESOLUTION IMAGING; AU NANOWIRES; CLOSE-PACKED PLANES; EQUILIBRIUM STRUCTURES; FIRST-PRINCIPLES CALCULATION; SURFACE STRESS; WRINKLING;

NANOWIRES;

EID: 84906085658     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl502259w     Document Type: Article

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