Optical, morphological and electrical studies of thermally vacuum evaporated CdTe thin films for photovoltaic applications

Solar Energy

Volumn 108, Issue , 2014, Pages 51-60

  Toma, O ^a   Ion, L ^a   Girtan, M ^b   Antohe, S ^a,c  

^a UNIVERSITY OF BUCHAREST   (Romania)

^b UNIVERSITÉ D'ANGERS   (France)

^c ACADEMY OF ROMANIAN SCIENTISTS   (Romania)

Author keywords

AFM; Cadmium telluride; SEM; Spectroscopic ellipsometry

Indexed keywords

ATOMIC FORCE MICROSCOPY; OPTICAL GLASS; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ELLIPSOMETRY; SUBSTRATES; THIN FILMS; VACUUM APPLICATIONS;

AFM; EXTINCTION COEFFICIENTS; MORPHOLOGICAL PROPERTIES; OPTICAL CHARACTERIZATION; OPTICAL SPECTROPHOTOMETRY; PHOTOVOLTAIC APPLICATIONS; SEMICONDUCTOR THIN FILMS; THERMAL-VACUUM EVAPORATION;

CADMIUM TELLURIDE;

ABSORPTION; ATOMIC FORCE MICROSCOPY; FILM; GLASS; MORPHOLOGY; PHOTOVOLTAIC SYSTEM; SCANNING ELECTRON MICROSCOPY; SPECTROPHOTOMETRY; SUBSTRATE;

EID: 84904698565     PISSN: 0038092X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solener.2014.06.031     Document Type: Article

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