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Volumn 90, Issue 1, 2014, Pages

Electric double-layer potentials and surface regulation properties measured by colloidal-probe atomic force microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; GEOMETRY; PARTICLE SIZE; PHASE INTERFACES; PROBES; SPHERES;

EID: 84904191031     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.90.012301     Document Type: Article
Times cited : (48)

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