Short range attraction between two similarly charged silica surfaces

Physical Review Letters

Volumn 96, Issue 17, 2006, Pages

  Zohar, Ohad ^a   Leizerson, Ilya ^a   Sivan, Uri ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COBALT; CONCENTRATION (PROCESS); POSITIVE IONS; SALINITY MEASUREMENT; SODIUM CHLORIDE;

CHARGED SILICA SURFACES; SALINE SOLUTION; SHORT RANGE ATTRACTION; TRIVALENT CATIONS;

SILICA;

COBALT; HEXAAMMINECOBALT(II); ION; SILICON DIOXIDE; SODIUM CHLORIDE;

ADSORPTION; ATOMIC FORCE MICROSCOPY; CHEMISTRY; STATIC ELECTRICITY; SURFACE PROPERTY;

ADSORPTION; COBALT; IONS; MICROSCOPY, ATOMIC FORCE; SILICON DIOXIDE; SODIUM CHLORIDE; STATIC ELECTRICITY; SURFACE PROPERTIES;

EID: 33646376911     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.96.177802     Document Type: Article

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