Impact of dimensional scaling and size effects on beyond CMOS All-Spin Logic interconnects

2014 IEEE International Interconnect Technology Conference / Advanced Metallization Conference, IITC/AMC 2014

Volumn , Issue , 2014, Pages 353-356

  Iraei, Rouhollah Mousavi ^a   Bonhomme, Phillip ^a   Kani, Nickvash ^a   Manipatruni, Sasikanth ^b   Nikonov, Dmitri E ^b   Young, Ian A ^b   Naeemi, Azad ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

METALLIZING; SIZE DETERMINATION;

BEYOND CMOS; CU INTERCONNECT; ELECTRICAL INTERCONNECTS; ENERGY-PER-BIT; SIZE EFFECTS;

INTEGRATED CIRCUIT INTERCONNECTS;

EID: 84903708784     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IITC.2014.6831833     Document Type: Conference Paper

References (17)

1. S. Manipatruni et al., IEEE Trans. Circuits and Systems, pp. 2801-2814, 2012.
2. S. Rakheja et al, IEEE Trans. Electron Devices, vol. 60, no. 11, pp. 3913-3919, 2013.
3. Ph. Bonhomme et al., "Circuit Simulation of Magnetization Dynamics and Spin Transport" to appear in IEEE Trans. Electron Devices.
4. J. Xiao, et al, Phys. Rev. B, vol. 72, p. 014446, July 2005.
5. M. Beleggia et al., J. Applied Physics, vol. 39, no. 5, p. 891, 2006.
6. J. Z. Sun, Phys. Rev. B, vol. 62, pp. 570-578, July 2000.
7. S. Manipatruni et al., arXiv: 1212. 3362, 2012.
8. Srinivasan, Srikant, et al. IEEE Trans. Magnetics, pp. 4026-4032, 2011.
9. G. Schmidt et al., Physical Review B, 62. 8: R4790, 2000.
10. H. Kitada et al., IEEE IITC, 2007.
11. J. J. Plombon et al., Applied Physics Letters 89. 11: 113124-113124, 2006.
12. W. Steinhögl et al., J. Appl. Phys., vol. 97, pp. 023706-1-7, 2005.
13. M. Shimada et al. JVST Microelectronics and Nanometer Structures 24. 1: 190-194, 2006.
14. I. Žuti et al., Physical Review Letters 97. 2: 026602, 2006.
15. Behin-Aein, Behtash, et al. Nature nanotechnology 5. 4 266-270, 2010.
16. G. G. Lopez, "The impact of interconnect process variations and size effects for gigascale integration", 2009.
17. J. Fabian et al., Journal of Vacuum Science & Technology Microelectronics and Nanometer Structures, 17(4), 1708-1715, 1999.