Stable single-layer honeycomblike structure of silica

Physical Review Letters

Volumn 112, Issue 24, 2014, Pages

  Özçelik, V Ongun ^a   Cahangirov, S ^a,b   Ciraci, S ^a  

^a BILKENT UNIVERSITY   (Turkey)

^b DONOSTIA INTERNATIONAL PHYSICS CENTER DIPC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE ROCKS; CRYSTALLOGRAPHY; SILICA; SILICON;

ELECTROMECHANICAL PROPERTY; EXTERNAL ELECTRIC FIELD; HONEYCOMBLIKE STRUCTURES; NEGATIVE POISSON'S RATIOS; PIEZOELECTRIC COEFFICIENT; SEMICONDUCTING BEHAVIOR; STRUCTURAL TRANSFORMATION; WIDE-BAND-GAP SEMICONDUCTOR;

CRYSTAL ATOMIC STRUCTURE;

NANOMATERIAL; SILICON DIOXIDE;

ARTICLE; CHEMICAL STRUCTURE; CHEMISTRY; CRYSTALLIZATION; MOLECULAR DYNAMICS;

CRYSTALLIZATION; MODELS, MOLECULAR; MOLECULAR DYNAMICS SIMULATION; NANOSTRUCTURES; SILICON DIOXIDE;

EID: 84903210064     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.112.246803     Document Type: Article

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