SCOPUS 정보 검색 플랫폼

Journal of Physics: Conference Series

Volumn 522, Issue 1, 2014, Pages

Direct detectors for electron microscopy

(3) Clough, R N a Moldovan, G b Kirkland, A I a

a UNIVERSITY OF OXFORD (United Kingdom)

b OXFORD INSTRUMENTS PLASMA TECHNOLOGY (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

DETECTIVE QUANTUM EFFICIENCY; DETECTOR PERFORMANCE; ELECTRICAL SIGNAL; HIGH SPATIAL FREQUENCY; HIGHER RESOLUTION; PERFORMANCE ENHANCEMENTS; PHOTON CONVERSION; PRIMARY ELECTRONS;

ELECTRONS;

EID: 84902989177 PISSN: 17426588 EISSN: 17426596 Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/522/1/012046 Document Type: Conference Paper

Times cited : (24)

References (8)

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3
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