How flat is your detector? Non-uniform annular detector sensitivity in STEM quantification

Journal of Physics: Conference Series

Volumn 522, Issue 1, 2014, Pages

  Macarthur, K E ^a   Jones, L B ^a   Nellist, P D ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; HARDWARE;

ACTIVE REGIONS; ANNULAR DETECTORS; DETECTION SENSITIVITY; HAADF-STEM; IMAGE QUANTIFICATION; IMAGE SIMULATIONS; NON-UNIFORM; NON-UNIFORMITIES;

IMAGE RECORDING;

EID: 84902955514     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/522/1/012018     Document Type: Conference Paper

References (5)

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4. H Katz-Boon, CJ Rossouw, C Dwyer, J Etheridge 2012 Ultramicroscopy 124C 61-70
5. Findlay S D, JM LeBeau 2013 Ultramicroscopy 124 52-60