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Journal of Applied Physics

Volumn 115, Issue 22, 2014, Pages

Piezoreflectance study of near band edge excitonic-transitions of mixed-layered crystal Mo(SxSe1-x)2 solid solutions

(7) Wu, Y J a Wu, P H a Jadczak, J a,d Huang, Y S a Ho, C H a Hsu, H P b Tiong, K K c

a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (Taiwan)

b MING CHI UNIVERSITY OF TECHNOLOGY (Taiwan)

c NATIONAL TAIWAN OCEAN UNIVERSITY (Taiwan)

d WROCLAW UNIVERSITY OF TECHNOLOGY (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

STATISTICAL MECHANICS; TEMPERATURE DISTRIBUTION;

EXCITONIC TRANSITION; MIXED CRYSTALS; NEAR BAND EDGE; PIEZOREFLECTANCE; SPECTRAL FEATURE; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE; TEMPERATURE VARIATION;

SOLID SOLUTIONS;

EID: 84902438698 PISSN: 00218979 EISSN: 10897550 Source Type: Journal
DOI: 10.1063/1.4882301 Document Type: Article

Times cited : (19)

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