-
2
-
-
0003672545
-
-
Wiley, Chichester, J.C. Veckerman (Ed.)
-
Surface Analysis 1997, Wiley, Chichester. J.C. Veckerman (Ed.).
-
(1997)
Surface Analysis
-
-
-
3
-
-
0003459529
-
-
Physical Electronics, Chichester
-
Moulder J.F., Stickle W.F., Sobol P.E., Bomben K.D., Chastain J. Handbook of X-ray Photoelectron Spectroscopy 1992, Physical Electronics, Chichester.
-
(1992)
Handbook of X-ray Photoelectron Spectroscopy
-
-
Moulder, J.F.1
Stickle, W.F.2
Sobol, P.E.3
Bomben, K.D.4
Chastain, J.5
-
4
-
-
0038976585
-
Photoelectron diffraction and holography: Present status and future prospects
-
Fadley C.S., Thevuthasan S., Kaduwela A.P., Westphal C., Kim Y.J., Ynzunza R., Len P., Tober E., Zhang F., Wang Z., Ruebush S., Budge A., Van Hove M.A. Photoelectron diffraction and holography: Present status and future prospects. J. Electron Spectr. Rel. Phenomena 1994, 68:19-47.
-
(1994)
J. Electron Spectr. Rel. Phenomena
, vol.68
, pp. 19-47
-
-
Fadley, C.S.1
Thevuthasan, S.2
Kaduwela, A.P.3
Westphal, C.4
Kim, Y.J.5
Ynzunza, R.6
Len, P.7
Tober, E.8
Zhang, F.9
Wang, Z.10
Ruebush, S.11
Budge, A.12
Van Hove, M.A.13
-
5
-
-
0000652973
-
The use of X-ray photoelectron take-off-angle experiments in the study of Langmuir-Blodgett films
-
Hazell L.B., Rizivi A.A., Brown I.S., Ainsworth S. The use of X-ray photoelectron take-off-angle experiments in the study of Langmuir-Blodgett films. Spectrochim. Acta 1983, 40B:739-744.
-
(1983)
Spectrochim. Acta
, vol.40 B
, pp. 739-744
-
-
Hazell, L.B.1
Rizivi, A.A.2
Brown, I.S.3
Ainsworth, S.4
-
6
-
-
0022664179
-
A model for determining the composition of layer structured samples using XPS electron take-off angle experiments
-
Hazell L.B., Brown I.S., Freisinger F. A model for determining the composition of layer structured samples using XPS electron take-off angle experiments. Surf. Interface Anal. 1986, 8:25-31.
-
(1986)
Surf. Interface Anal.
, vol.8
, pp. 25-31
-
-
Hazell, L.B.1
Brown, I.S.2
Freisinger, F.3
-
7
-
-
0031212152
-
Model for analysis of XPS electron take-off angle experiments in layer-structured samples: Determination of attenuation lengths in a well-characterized Langmuir-Blodgett film
-
Suzuki N., Iimura K., Satoh S., Saito Y., Kato T., Tanaka A. Model for analysis of XPS electron take-off angle experiments in layer-structured samples: Determination of attenuation lengths in a well-characterized Langmuir-Blodgett film. Surf. Interface Anal. 1997, 25:650-659.
-
(1997)
Surf. Interface Anal.
, vol.25
, pp. 650-659
-
-
Suzuki, N.1
Iimura, K.2
Satoh, S.3
Saito, Y.4
Kato, T.5
Tanaka, A.6
-
8
-
-
0000216113
-
Surface nanostructure determination by X-ray photoemission spectroscopy peak shape analysis
-
Tougaard S. Surface nanostructure determination by X-ray photoemission spectroscopy peak shape analysis. J. Vac. Sci. Technol. A 1996, 14:1415-1423.
-
(1996)
J. Vac. Sci. Technol. A
, vol.14
, pp. 1415-1423
-
-
Tougaard, S.1
-
9
-
-
0032047486
-
Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape
-
Tougaard S. Accuracy of the non-destructive surface nanostructure quantification technique based on analysis of the XPS or AES peak shape. Surf. Interface Anal. 1998, 26:249-269.
-
(1998)
Surf. Interface Anal.
, vol.26
, pp. 249-269
-
-
Tougaard, S.1
-
11
-
-
0000060978
-
Surface damage of organic materials during XPS analysis (2)
-
Organic Materials Group of SASJ
-
Suzuki N., Sakamoto T., Isano T., Iimura K., Kato T., Tohma H., Maruyama T., Miura K. Surface damage of organic materials during XPS analysis (2). J. Surf. Anal. 1999, 5:224-227. Organic Materials Group of SASJ.
-
(1999)
J. Surf. Anal.
, vol.5
, pp. 224-227
-
-
Suzuki, N.1
Sakamoto, T.2
Isano, T.3
Iimura, K.4
Kato, T.5
Tohma, H.6
Maruyama, T.7
Miura, K.8
-
12
-
-
0038427603
-
A method of evaluating sample damage in XPS using nitrocellulose as a standard for organic materials
-
Organic Materials Group of SASJ
-
Maruyama T., Suzuki N., Tohma H., Miura K. A method of evaluating sample damage in XPS using nitrocellulose as a standard for organic materials. J. Surf. Anal. 1999, 6:59-65. Organic Materials Group of SASJ.
-
(1999)
J. Surf. Anal.
, vol.6
, pp. 59-65
-
-
Maruyama, T.1
Suzuki, N.2
Tohma, H.3
Miura, K.4
-
13
-
-
0034244923
-
Degradation of organosilane monolayer during XPS measurement
-
Suzuki N., Isano T., Sakamoto T., Saino T., Iimura K., Kato T. Degradation of organosilane monolayer during XPS measurement. Surf. Interface Anal. 2000, 30:301-304.
-
(2000)
Surf. Interface Anal.
, vol.30
, pp. 301-304
-
-
Suzuki, N.1
Isano, T.2
Sakamoto, T.3
Saino, T.4
Iimura, K.5
Kato, T.6
-
14
-
-
0342397594
-
Practical aspects of charge compensation in X-ray photoelectron spectroscopy
-
Fulghum J.E. Practical aspects of charge compensation in X-ray photoelectron spectroscopy. J. Surf. Anal. 1999, 6:13-21.
-
(1999)
J. Surf. Anal.
, vol.6
, pp. 13-21
-
-
Fulghum, J.E.1
-
15
-
-
85031221098
-
Comparison of XPS spectra of inorganic materials with various kinds of pre-treatment methods
-
Fukumoto N., Li B.Q., Kojima I. Comparison of XPS spectra of inorganic materials with various kinds of pre-treatment methods. J. Surf. Anal. 1999, 5:200-203.
-
(1999)
J. Surf. Anal.
, vol.5
, pp. 200-203
-
-
Fukumoto, N.1
Li, B.Q.2
Kojima, I.3
-
16
-
-
85031212611
-
Formation mechanism of indium microcrystals on ion-bombarded InP surfaces
-
Homma Y. Formation mechanism of indium microcrystals on ion-bombarded InP surfaces. J. Surf. Anal. 1997, 3:641-645.
-
(1997)
J. Surf. Anal.
, vol.3
, pp. 641-645
-
-
Homma, Y.1
-
17
-
-
0012245942
-
Auger depth profiling analysis of InP/GaInAsP multilayer thin films
-
Ogiwara T., Tanuma S., Nagasawa Y., Ikeo N. Auger depth profiling analysis of InP/GaInAsP multilayer thin films. Microbeam Anal. 1993, 2:133-138.
-
(1993)
Microbeam Anal.
, vol.2
, pp. 133-138
-
-
Ogiwara, T.1
Tanuma, S.2
Nagasawa, Y.3
Ikeo, N.4
-
18
-
-
3342966099
-
Some aspects of shake-up phenomena in some simple polymer systems
-
Clark D.T., Adams D.B., Dilks A., Peeling J., Thomas H.R. Some aspects of shake-up phenomena in some simple polymer systems. J. Electron Spectr. Rel. Phenom. 1976, 8:51-60.
-
(1976)
J. Electron Spectr. Rel. Phenom.
, vol.8
, pp. 51-60
-
-
Clark, D.T.1
Adams, D.B.2
Dilks, A.3
Peeling, J.4
Thomas, H.R.5
-
19
-
-
84872333670
-
Surface analysis of cubic SiC thin films prepared by high vacuum chemical vapor deposition using 1,3-disilabutane
-
Yu K.-S., Lee J.W., Sung M.M., Lee S.-B., Kim Y. Surface analysis of cubic SiC thin films prepared by high vacuum chemical vapor deposition using 1,3-disilabutane. J. Surf. Anal. 1999, 5:308-311.
-
(1999)
J. Surf. Anal.
, vol.5
, pp. 308-311
-
-
Yu, K.-S.1
Lee, J.W.2
Sung, M.M.3
Lee, S.-B.4
Kim, Y.5
-
20
-
-
0001178270
-
Fluorination of carbon blacks: An x-ray photoelectron spectroscopy study: I. A literature review of XPS studies of fluorinated carbons. XPS investigation of some reference compounds
-
Nanse G., Papirer E., Fioux P., Moguet F., Tressaud A. Fluorination of carbon blacks: An x-ray photoelectron spectroscopy study: I. A literature review of XPS studies of fluorinated carbons. XPS investigation of some reference compounds. Carbon 1997, 35:175-194.
-
(1997)
Carbon
, vol.35
, pp. 175-194
-
-
Nanse, G.1
Papirer, E.2
Fioux, P.3
Moguet, F.4
Tressaud, A.5
-
21
-
-
0031071787
-
Using XPS to investigate fiber/matrix chemical interactions in carbon-fiber-reinforced compounds
-
Weitzsacker C.L., Xie M., Drzal L.T. Using XPS to investigate fiber/matrix chemical interactions in carbon-fiber-reinforced compounds. Surf. Interface Anal. 1997, 25:53-63.
-
(1997)
Surf. Interface Anal.
, vol.25
, pp. 53-63
-
-
Weitzsacker, C.L.1
Xie, M.2
Drzal, L.T.3
-
22
-
-
0031168028
-
X-ray photoelectron spectroscopy studies of carbon-fiber surfaces. 21. Comparison of carbon fibers electrochemically oxidized in acid using achromatic and monochromatic XPS
-
Viswanathan H., Rooke M.A., Sherwood P.A. X-ray photoelectron spectroscopy studies of carbon-fiber surfaces. 21. Comparison of carbon fibers electrochemically oxidized in acid using achromatic and monochromatic XPS. Surf. Interface Anal. 1997, 25:409-417.
-
(1997)
Surf. Interface Anal.
, vol.25
, pp. 409-417
-
-
Viswanathan, H.1
Rooke, M.A.2
Sherwood, P.A.3
-
23
-
-
0030235666
-
Surface analysis of carbon and carbon fibers for composites
-
Sherwood P.M.A. Surface analysis of carbon and carbon fibers for composites. J. Electron Spectr. Rel. Phenom. 1996, 81:319-342.
-
(1996)
J. Electron Spectr. Rel. Phenom.
, vol.81
, pp. 319-342
-
-
Sherwood, P.M.A.1
-
24
-
-
0024031788
-
Chemical derivatization and surface analysis
-
Batich C.D. Chemical derivatization and surface analysis. Appl. Surf. Sci. 1988, 32:57-73.
-
(1988)
Appl. Surf. Sci.
, vol.32
, pp. 57-73
-
-
Batich, C.D.1
-
26
-
-
84902049303
-
-
Wiley, Chichester, J.C. Veckerma (Ed.)
-
Surface Analysis 1997, 88. Wiley, Chichester. J.C. Veckerma (Ed.).
-
(1997)
Surface Analysis
, pp. 88
-
-
-
28
-
-
0032662675
-
Nitrogen incorporation into borondoped graphite and formation of B-N bonding
-
Konno H., Nakahashi T., Inagaki M., Sogabe T. Nitrogen incorporation into borondoped graphite and formation of B-N bonding. Carbon 1999, 37:471-475.
-
(1999)
Carbon
, vol.37
, pp. 471-475
-
-
Konno, H.1
Nakahashi, T.2
Inagaki, M.3
Sogabe, T.4
-
29
-
-
0000152851
-
Nitrogen incorporation into borondoped graphite
-
Inagaki M., Nakahashi T., Konno H., Sogabe T. Nitrogen incorporation into borondoped graphite. Carbon 1997, 35:1994-1995.
-
(1997)
Carbon
, vol.35
, pp. 1994-1995
-
-
Inagaki, M.1
Nakahashi, T.2
Konno, H.3
Sogabe, T.4
-
30
-
-
0033732942
-
Structural and electrochemical properties of pristine and B-doped materials for the anode of Li-ion secondary batteries
-
Kim C., Fujino F., Hayashi T., Endo M., Dresselhaus M.S. Structural and electrochemical properties of pristine and B-doped materials for the anode of Li-ion secondary batteries. J. Electrochem. Soc. 2000, 147:1265-1270.
-
(2000)
J. Electrochem. Soc.
, vol.147
, pp. 1265-1270
-
-
Kim, C.1
Fujino, F.2
Hayashi, T.3
Endo, M.4
Dresselhaus, M.S.5
-
31
-
-
0030645046
-
State analysis of nitrogen in carbon film derived from polyimide Kapton
-
Konno H., Nakahashi T., Inagaki M. State analysis of nitrogen in carbon film derived from polyimide Kapton. Carbon 1997, 35:669-674.
-
(1997)
Carbon
, vol.35
, pp. 669-674
-
-
Konno, H.1
Nakahashi, T.2
Inagaki, M.3
-
32
-
-
0032309667
-
Chemical state of nitrogen atoms in carbon films prepared from nitrogen-containing polymer films
-
Nakahashi T., Konno H., Inagaki M. Chemical state of nitrogen atoms in carbon films prepared from nitrogen-containing polymer films. Solid State Ionics 1998, 113-115:73-77.
-
(1998)
Solid State Ionics
, pp. 73-77
-
-
Nakahashi, T.1
Konno, H.2
Inagaki, M.3
-
33
-
-
0006068988
-
Denitrogenation behavior and tensile strength increased during carbonization of stabilized PAN fibers
-
Mittal J., Konno H., Inagaki M., Bahl O.P. Denitrogenation behavior and tensile strength increased during carbonization of stabilized PAN fibers. Carbon 1998, 36:1327-1330.
-
(1998)
Carbon
, vol.36
, pp. 1327-1330
-
-
Mittal, J.1
Konno, H.2
Inagaki, M.3
Bahl, O.P.4
-
34
-
-
0032154669
-
Solid solubility of nitrogen in amorphous carbon films deposited in electron cyclotron resonance plasma
-
Saito H., Inoue T., Ohshio S. Solid solubility of nitrogen in amorphous carbon films deposited in electron cyclotron resonance plasma. Jpn. J. Appl. Phys. 1998, 37:4983-4988.
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, pp. 4983-4988
-
-
Saito, H.1
Inoue, T.2
Ohshio, S.3
-
35
-
-
0009453098
-
Comparison of bromine-treatment and iodine-treatment in the carbonization of pitches
-
Miyajima N., Yasuda E., Rand B., Akatsu T., Kameshima K., Tanabe Y. Comparison of bromine-treatment and iodine-treatment in the carbonization of pitches. Tanso 2000, 405-409.
-
(2000)
Tanso
, pp. 405-409
-
-
Miyajima, N.1
Yasuda, E.2
Rand, B.3
Akatsu, T.4
Kameshima, K.5
Tanabe, Y.6
-
38
-
-
0011740843
-
Surface damage of organic materials during XPS analysis (3)
-
Organic Materials Group of SASJ
-
Endo K., Maeda S., Miura H., Ohmori K., Miura K., Tohma H., Maruyama T. Surface damage of organic materials during XPS analysis (3). J. Surf. Anal. 1999, 6:54-58. Organic Materials Group of SASJ.
-
(1999)
J. Surf. Anal.
, vol.6
, pp. 54-58
-
-
Endo, K.1
Maeda, S.2
Miura, H.3
Ohmori, K.4
Miura, K.5
Tohma, H.6
Maruyama, T.7
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