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Journal of Electronic Materials

Volumn 43, Issue 6, 2014, Pages 1608-1612

Practical contact resistance measurement method for bulk Bi 2Te3-based thermoelectric devices

(3) Gupta, Rahul P a McCarty, Robin a Sharp, Jeff a

a Marlow Industries Inc (United States)

Author keywords

bismuth telluride; contact resistance; Thermoelectrics

Indexed keywords

BISMUTH COMPOUNDS; CONTACT RESISTANCE; FILMS; METAL COATINGS; SENSITIVITY ANALYSIS; UNCERTAINTY ANALYSIS;

BISMUTH TELLURIDE; CONTACT RESISTIVITIES; MANUFACTURING TECHNIQUES; MEASUREMENT TECHNIQUES; RESISTANCE MEASUREMENT; RESISTIVITY VARIATION; THERMOELECTRIC DEVICES; THERMOELECTRICS;

EXTRACTION;

EID: 84901839431 PISSN: 03615235 EISSN: None Source Type: Journal
DOI: 10.1007/s11664-013-2806-6 Document Type: Article

Times cited : (42)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.