Core level excitations - A fingerprint of structural and electronic properties of epitaxial silicene

Journal of Chemical Physics

Volumn 140, Issue 18, 2014, Pages

  Friedlein, R ^a   Fleurence, A ^a   Aoyagi, K ^a   De Jong, M P ^b   Van Bui, H ^b   Wiggers, F B ^b   Yoshimoto, S ^c   Koitaya, T ^c   Shimizu, S ^c   Noritake, H ^c   Mukai, K ^c   Yoshinobu, J ^c   Yamada Takamura, Y ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

^b UNIVERSITY OF TWENTE   (Netherlands)

^c UNIVERSITY OF TOKYO   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; CORE LEVELS; ELECTRONIC PROPERTIES; PHOTOELECTRON SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON;

CORE LEVEL EXCITATION; CORE-LEVEL SPECTRA; HIGH RESOLUTION; INTER-BAND TRANSITION; NEAR-EDGE X-RAY ABSORPTION FINE STRUCTURE SPECTRUM; STRIPE DOMAIN; STRUCTURAL AND ELECTRONIC PROPERTIES; VALENCE ELECTRON;

LIGHT ABSORPTION;

EID: 84901749727     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4875075     Document Type: Article

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