Amplitude characterization of memristive devices

Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems

Volumn , Issue , 2013, Pages 45-48

  Duarte, Joao Capela ^a,b   Martins, Ernesto Ventura ^b   Alves, Luis Nero ^a,b  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

amplitude characterization; hysteretic loops; Memristive devices and systems

Indexed keywords

HYSTERESIS LOOPS; MEMRISTORS;

DEVICES AND SYSTEMS; FREQUENCY CHARACTERIZATION; HYSTERETIC LOOP; MEMORY PROPERTIES; MORPHOLOGICAL APPROACH; PEAK AMPLITUDE; STIMULUS FREQUENCY; TIO;

CHARACTERIZATION;

EID: 84901395268     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICECS.2013.6815341     Document Type: Conference Paper

References (11)

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