Frequency characterization of memristive devices

2013 European Conference on Circuit Theory and Design, ECCTD 2013 - Proceedings

Volumn , Issue , 2013, Pages

  Duarte, João Capela ^a   Martins, Ernesto Ventura ^a   Alves, Luis Nero ^a,b  

^a INSTITUTO DE TELECOMUNICAÇÕES   (Portugal)

^b UNIVERSITY OF AVEIRO   (Portugal)

Author keywords

frequency characterization; hysteretic loops; Memristive devices and systems

Indexed keywords

CIRCUIT THEORY; HYSTERESIS; HYSTERESIS LOOPS; TITANIUM DIOXIDE;

DEVICES AND SYSTEMS; FREQUENCY BEHAVIOR; FREQUENCY CHARACTERIZATION; FREQUENCY DEPENDENCE; HYSTERETIC LOOP; MEMORY PROPERTIES;

MEMRISTORS;

EID: 84892667515     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ecctd.2013.6662212     Document Type: Conference Paper

References (10)

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3. D.B. Strukov, G.S. Snider, D.R. Stewart, R.S. Williams, "The Missing Memristor Found", Nature Letters, Vol. 453, May 2008.
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9. S. Gazabare, R.J. Pieper, W. Wondmagegn, "Observations on Frequency Sensituvity of Memristors", 44th IEEE Southeastern Symposium on System Theory, Jacksonville, Florida, USA, March 2012.
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