Atomic scale verification of oxide-ion vacancy distribution near a single grain boundary in YSZ

Scientific Reports

Volumn 3, Issue , 2013, Pages

  An, Jihwan ^a   Park, Joong Sun ^a,b   Koh, Ai Leen ^a   Lee, Hark B ^a   Jung, Hee Joon ^a   Schoonman, Joop ^c   Sinclair, Robert ^a   Gur, Turgut M ^a   Prinz, Fritz B ^a  

^a Stanford University   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84901302867     PISSN: None     EISSN: 20452322     Source Type: Journal    
DOI: 10.1038/srep02680     Document Type: Article

References (20)

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