SCOPUS 정보 검색 플랫폼

Volumn 60, Issue 1, 2012, Pages 1-7

Enhanced oxygen exchange and incorporation at surface grain boundaries on an oxide ion conductor

(9) Shim, Joon Hyung a,c Park, Joong Sun a Holme, Timothy P a Crabb, Kevin a Lee, Wonyoung a Kim, Young Beom a Tian, Xu b Gür, Turgut M a Prinz, Fritz B a

a Stanford University (United States)

b STANFORD UNIVERSITY (United States)

c Korea University (South Korea)

Author keywords

Grain boundary; Secondary ion mass spectrometry; Yttria stabilized zirconia

Indexed keywords

A.C. IMPEDANCE SPECTROSCOPY; BOUNDARY REGIONS; DIFFERENT SIZES; ELECTROCHEMICAL DEVICES; ELECTRODE IMPEDANCE; ENHANCED PERFORMANCE; GRAIN BOUNDARY DENSITIES; HIGH ACTIVITY; HIGH DENSITY; HIGH SPATIAL RESOLUTION; LOW TEMPERATURES; NANO-STRUCTURED; OXIDE ION CONDUCTORS; OXIDE IONS; OXYGEN EXCHANGE; OXYGEN INCORPORATION; OXYGEN ISOTOPE EXCHANGE; POLYCRYSTALLINE; PREFERENTIAL PATHWAYS; SECONDARY IONS; SPECTROSCOPIC EVIDENCE; SURFACE MAPPING;

GRAIN BOUNDARIES; ION EXCHANGE; IONS; ISOTOPES; OXYGEN; SECONDARY EMISSION; SECONDARY ION MASS SPECTROMETRY; SPECTROMETRY; SPECTROSCOPY; YTTRIUM ALLOYS; ZIRCONIA;

YTTRIA STABILIZED ZIRCONIA;

EID: 80054846937 PISSN: 13596454 EISSN: None Source Type: Journal
DOI: 10.1016/j.actamat.2011.09.050 Document Type: Article

Times cited : (86)

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