Identification of wheat quality using THz spectrum

Optics Express

Volumn 22, Issue 10, 2014, Pages 12533-12544

  Ge, Hongyi ^a,b   Jiang, Yuying ^a,b   Xu, Zhaohui ^c   Lian, Feiyu ^c   Zhang, Yuan ^c   Xia, Shanhong ^a  

^a INSTITUTE OF ELECTRONICS   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN (AGRICULTURAL PRODUCT); LEAST SQUARES APPROXIMATIONS; NEURAL NETWORKS; RADIAL BASIS FUNCTION NETWORKS; SUPPORT VECTOR MACHINES;

BACK PROPAGATION NEURAL NETWORKS; CONTRIBUTION RATE; PARTIAL LEAST SQUARES REGRESSION; PRINCIPAL COMPONENT REGRESSION; PRINCIPAL COMPONENTS; RADIAL BASIS FUNCTIONS; TERAHERTZ TIME DOMAIN SPECTROSCOPY; THZ TECHNOLOGY;

PRINCIPAL COMPONENT ANALYSIS;

ALGORITHM; ARTIFICIAL NEURAL NETWORK; CHEMISTRY; COMPUTER PROGRAM; PRINCIPAL COMPONENT ANALYSIS; PROCEDURES; TERAHERTZ SPECTROSCOPY; WHEAT;

ALGORITHMS; NEURAL NETWORKS (COMPUTER); PRINCIPAL COMPONENT ANALYSIS; SOFTWARE; TERAHERTZ SPECTROSCOPY; TRITICUM;

EID: 84901262101     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.012533     Document Type: Article

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