Receptive fields selection for binary feature description

IEEE Transactions on Image Processing

Volumn 23, Issue 6, 2014, Pages 2583-2595

  Fan, Bin ^a   Kong, Qingqun ^a   Trzcinski, Tomasz ^b   Wang, Zhiheng ^c   Pan, Chunhong ^a   Fua, Pascal ^b  

^a INSTITUTE OF AUTOMATION   (China)

^b EPFL   (Switzerland)

^c HENAN POLYTECHNIC UNIVERSITY   (China)

Author keywords

binary descriptor; image matching; Local invariant descriptor; local receptive field; object recognition

Indexed keywords

EXPERIMENTS; IMAGE MATCHING;

DATA-DRIVEN METHODS; DESCRIPTORS; EXPERT EXPERIENCE; FEATURE DESCRIPTION; INVARIANT DESCRIPTOR; LEARNING-BASED METHODS; LOCAL DESCRIPTORS; RECEPTIVE FIELDS;

OBJECT RECOGNITION;

EID: 84901020843     PISSN: 10577149     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIP.2014.2317981     Document Type: Article

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