A real-space study of random extended defects in solids: Application to disordered Stone-Wales defects in graphene

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 61, Issue , 2014, Pages 191-197

  Chowdhury, Suman ^a   Baidya, Santu ^b   Nafday, Dhani ^b   Halder, Soumyajyoti ^d   Kabir, Mukul ^c   Sanyal, Biplab ^d   Saha Dasgupta, Tanusri ^b   Jana, Debnarayan ^a   Mookerjee, Abhijit ^b  

^a UNIVERSITY OF CALCUTTA   (India)

^b S N BOSE NATIONAL CENTRE FOR BASIC SCIENCES   (India)

^c INDIAN INSTITUTE OF SCIENCE EDUCATION AND RESEARCH   (India)

^d UPPSALA UNIVERSITY   (Sweden)

Author keywords

Extended disordered defect; Real space recursion method

Indexed keywords

GRAPHENE; POINT DEFECTS;

DENSITY OF STATE; EXTENDED DEFECT; GRAPHENE SHEETS; REAL SPACE METHODS; RECURSION METHODS; SPECIFIC DEFECTS; STONE-WALES DEFECTS; TRANSLATIONAL SYMMETRY;

DEFECTS;

EID: 84900847243     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2014.04.002     Document Type: Article

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