Metric learning based structural appearance model for robust visual tracking

IEEE Transactions on Circuits and Systems for Video Technology

Volumn 24, Issue 5, 2014, Pages 865-877

  Wu, Yuwei ^a   Ma, Bo ^a   Yang, Min ^a   Zhang, Jian ^b   Jia, Yunde ^a  

^a BEIJING INSTITUTE OF TECHNOLOGY   (China)

^b UNIVERSITY OF TECHNOLOGY SYDNEY   (Australia)

Author keywords

Appearance modeling; multiple instance metric learning; multiscale max pooling; object tracking; sparse coding

Indexed keywords

BAYESIAN NETWORKS; IMAGE PROCESSING; INFERENCE ENGINES;

APPEARANCE MODELING; MAX-POOLING; METRIC LEARNING; OBJECT TRACKING; SPARSE CODING;

TRACKING (POSITION);

EID: 84900529184     PISSN: 10518215     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCSVT.2013.2291283     Document Type: Article

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