Layer-by-layer AuCl3 doping of stacked graphene films

Physica Status Solidi - Rapid Research Letters

Volumn 8, Issue 5, 2014, Pages 441-444

  Oh, Sooyeoun ^a   Kim, Byung Jae ^a   Kim, Jihyun ^a  

^a Korea University   (South Korea)

Author keywords

Micro Raman spectroscopy; Sheet resistance; Transmittance

Indexed keywords

GRAPHENE; MEASUREMENTS; OPACITY; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SHEET RESISTANCE;

BETTER PERFORMANCE; DEPOSITION METHODS; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL CHARACTERISTIC; FOUR-POINT PROBE MEASUREMENTS; MICRO RAMAN SPECTROSCOPY; TRANSMITTANCE; TRANSMITTANCE MEASUREMENTS;

SEMICONDUCTOR DOPING;

EID: 84900426926     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201409085     Document Type: Article

References (21)

1. S. J. Chang, C. F. Shen, W. S. Chen, C. T. Kuo, T. K. Ko, S. C. Shei, and J. K. Sheu, Appl. Phys. Lett. 91, 013504 (2007).
2. J. Herrero and C. Guillén, Thin Solid Films 451, 630 (2004).
3. D. C. Paine, H.-Y. Yeom, and B. Yaglioglu, in: Flexible Flat Panel Display, edited by G. P. Crawford (John Wiley and Sons, Ltd., West Sussex, England, 2005), Chap. 5.
4. J.-Y. Lee, S. T. Connor, Y. Cui, and P. Peumans, Nano Lett. 8, 689 (2008).
5. Z. Wu, Z. Chen, X. Du, J. M. Logan, J. Sippel, M. Nikolou, K. Kamaras, J. R. Reynolds, D. B. Tanner, A. F. Hebard, and A. G. Rinzler, Science 305, 1273 (2004).
6. G. Jo, M. Choe, S. Lee, W. Park, Y. H. Kahng, and T. Lee, Nanotechnology 23, 112001 (2012).
7. G. Eda, G. Fanchini, and M. Chhowalla, Nature Nanotechnol. 3, 270 (2008).
8. X. Li, Y. Zhu, W. Cai, M. Borysiak, B. Han, D. Chen, R. D. Piner, L. Colombo, and R. S. Ruoff, Nano Lett. 9, 4359 (2009).
9. M. Choe, C.-Y. Cho, J.-P. Shim, W. Park, S. K. Lim, W.-K. Hong, B. H. Lee, D.-S. Lee, S.-J. Park, and T. Lee, Appl. Phys. Lett. 101, 031115 (2012).
10. R. Chen, S. R. Das, C. Jeong, M. R. Khan, D. B. Janes, and M. A. Alam, Adv. Funct. Mater. 23, 5150 (2013).
11. B.-J. Kim, G. Yang, H.-Y. Kim, K. H. Baik, M. A. Mastro, J. K. Hite, C. R. Eddy, Jr., F. Ren, S. J. Pearton, and J. Kim, Opt. Express 21, 29025 (2013).
12. K. C. Kwon, B. J. Kim, J.-L. Lee, and S. Y. Kim, J. Mater. Chem. C 1, 2463 (2013).
13. I. Khrapach, F. Withers, T. H. Bointon, D. K. Polyushkin, W. L. Barnes, S. Russo, and M. F. Craciun, Adv. Mater. 24, 2844 (2012).
14. F. Güneş, H.-J. Shin, C. Biswas, G. H. Han, E. S. Kim, S. J. Chae, J.-Y. Choi, and Y. H. Lee, ACS Nano 4, 4595 (2010).
15. S. Bae, S. J. Kim, D. Shin, J.-H. Ahn, and B. H. Hong, Phys. Scr. T 146, 014024 (2012).
16. K. C. Kwon, B. J. Kim, J.-L. Lee, and S. Y. Kim, J. Mater. Chem. C 1, 2463 (2013).
17. K. C. Kwon, K. S. Choi, and S. Y. Kim, Adv. Funct. Mater. 22, 4724 (2012).
18. A. Reina, X. Jia, J. Ho, D. Nezich, H. Son, V. Bulovic, M. S. Dresselhaus, and J. Kong, Nano Lett. 9, 30 (2009).
19. K. K. Kim, A. Reina, Y. Shi, H. Park, L.-J. Li, Y. H. Lee, and J. Kong, Nanotechnology 21, 285205 (2010).
20. H.-J. Shin, W. M. Choi, D. Choi, G. H. Han, S.-M. Yoon, H.-K. Park, S.-W. Kim, Y. W. Jin, S. Y. Lee, J. M. Kim, J.-Y. Choi, and Y. H. Lee, J. Am. Chem. Soc. 132, 15603 (2010).
21. A. Kasry, M. A. Kuroda, G. J. Martyna, G. S. Tulevski, and A. A. Bol, ACS Nano 4, 3839 (2010).