Observations of artefacts in the x-ray ptychography method

Optics Express

Volumn 22, Issue 9, 2014, Pages 10294-10303

  Burdet, Nicolas ^a,b   Morrison, Graeme R ^a,b   Huang, Xiaojing ^c   Shi, Xiaowen ^d   Clark, Jesse N ^a,b   Zhang, Fucai ^a,b   Civita, Maria ^a,b   Harder, Ross ^e   Robinson, Ian K ^a,b  

^a UNIVERSITY COLLEGE LONDON   (United Kingdom)

^b Research Complex at Harwell   (United Kingdom)

^c BROOKHAVEN NATIONAL LABORATORY   (United States)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^e ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE RECONSTRUCTION;

COHERENT DIFFRACTION IMAGING; DISTANCE SCALE; LENGTH SCALE; PHASE CONTRASTS; SIEMENS STARS; TEST PATTERN;

DIFFRACTION;

EID: 84899873229     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.22.010294     Document Type: Article

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