Sample thickness and quantitative concentration measurements in Br K-edge XANES spectroscopy of organic materials

Journal of Synchrotron Radiation

Volumn 21, Issue 3, 2014, Pages 623-626

  Leri, Alessandra C ^a   Ravel, Bruce ^b  

^a MARYMOUNT MANHATTAN COLLEGE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

bromine; concentration measurement; thickness correction; thickness effect; XANES

Indexed keywords

BROMINE; X RAY ABSORPTION NEAR EDGE STRUCTURE SPECTROSCOPY;

CONCENTRATION MEASUREMENT; ELEMENTAL CONCENTRATIONS; EMPIRICAL CORRECTION FACTOR; QUANTITATIVE CONCENTRATION MEASUREMENTS; QUANTITATIVE INFORMATION; THICKNESS CORRECTION; THICKNESS EFFECT; XANES;

X RAYS;

EID: 84899807804     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S1600577514001283     Document Type: Article

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