Performance of a four-element Si drift detector for X-ray absorption fine-structure spectroscopy: Resolution, maximum count rate, and dead-time correction with incorporation into the ATHENA data analysis software

Journal of Synchrotron Radiation

Volumn 17, Issue 3, 2010, Pages 409-413

  Woicik, J C ^a   Ravel, B ^a   Fischer, D A ^a   Newburgh, W J ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

ATHENA data analysis software; Dead time correction; Si drift detector; X ray absorption fine structure spectroscopy

Indexed keywords

BEAM LINES; COUNT RATES; COUNTING EFFICIENCY; DATA ANALYSIS; DATA ANALYSIS SOFTWARES; DEAD-TIME CORRECTION; DETECTOR ELEMENTS; FLUORESCENCE LINES; FOUR-CHANNEL; MAXIMUM THROUGH-PUT; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; NATIONAL SYNCHROTRON LIGHT SOURCES; SI-DRIFT DETECTORS; TOTAL COUNTS; X RAY ABSORPTION FINE STRUCTURES;

ABSORPTION; COMPUTER SOFTWARE; DETECTORS; FLUORESCENCE; LIGHT SOURCES; MANGANESE; MANGANESE COMPOUNDS; SECURITY OF DATA; SILICON; SPECTRUM ANALYSIS; SYNCHROTRON RADIATION; X RAY ABSORPTION; X RAY ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 77951465429     PISSN: 09090495     EISSN: 16005775     Source Type: Journal    
DOI: 10.1107/S0909049510009064     Document Type: Article

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