Experimental observation of dirac-like surface states and topological phase transition in Pb1-xSnxTe (111) films

Physical Review Letters

Volumn 112, Issue 18, 2014, Pages

  Yan, Chenhui ^a,b,c   Liu, Junwei ^a,b   Zang, Yunyi ^a,b   Wang, Jianfeng ^a,b   Wang, Zhenyu ^a,b   Wang, Peng ^a,b   Zhang, Zhi Dong ^c   Wang, Lili ^a,b   Ma, Xucun ^a,b   Ji, Shuaihua ^a,b   He, Ke ^a,b   Fu, Liang ^d   Duan, Wenhui ^a,b   Xue, Qi Kun ^a,b   Chen, Xi ^a,b  

^a TSINGHUA UNIVERSITY   (China)

^b Collaborative Innovation Center of Quantum Matter ^*  (China)

^c INSTITUTE OF METAL RESEARCH   (China)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; PHOTOELECTRON SPECTROSCOPY; SURFACE STATES; TOPOLOGY;

ANGLE RESOLVED PHOTOEMISSION SPECTROSCOPY; CRYSTALLINE INSULATORS; CRYSTALLINE SYMMETRY; FUNDAMENTAL RESEARCH; HYBRIDIZATION GAP; THICKNESS OF THE FILM; TOPOLOGICAL PHASE; TOPOLOGICAL PROPERTIES;

SEMICONDUCTOR DOPING;

EID: 84899792511     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.112.186801     Document Type: Article

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