A new thermographic NDT for condition monitoring of electrical components using ANN with confidence level analysis

ISA Transactions

Volumn 53, Issue 3, 2014, Pages 717-724

  Huda, A S N ^a   Taib, S ^a   Ghazali, K H ^b   Jadin, M S ^b  

^a SCHOOL OF PHYSICS   (Malaysia)

^b UNIVERSITY MALAYSIA PAHANG   (Malaysia)

Author keywords

Condition; Confidence level; Electrical components; Infrared thermography; MLP network

Indexed keywords

CONDITION MONITORING; DAMAGE DETECTION; NEURAL NETWORKS; THERMOGRAPHY (IMAGING);

AUTOMATIC DIAGNOSTIC SYSTEMS; CONDITION; CONFIDENCE LEVELS; ELECTRICAL COMPONENTS; FALSE POSITIVE AND FALSE NEGATIVES; INTELLIGENT DIAGNOSIS SYSTEM; LEVENBERG-MARQUARDT TRAINING ALGORITHM; MULTILAYERED PERCEPTRON NETWORKS;

NONDESTRUCTIVE EXAMINATION;

EID: 84899634048     PISSN: 00190578     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.isatra.2014.02.003     Document Type: Article

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